Simulated non-contact atomic force microscopy for GaAs surfaces based on real-space pseudopotentials

Applied Surface Science

Volumn 303, Issue , 2014, Pages 163-167

  Kim, Minjung ^a   Chelikowsky, James R ^a,b  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Density functional theory; GaAs(1 1 0) surface; Noncontact atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATION THEORY; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; SEMICONDUCTING GALLIUM; TIME VARYING SYSTEMS;

AB INITIO PSEUDOPOTENTIAL METHOD; AB INITIO SIMULATIONS; COMPUTATIONAL WORK; EXPLICIT MODELING; GAAS (1 1 0); NONCONTACT ATOMIC FORCE MICROSCOPY; PSEUDOPOTENTIALS; TIP-SURFACE INTERACTION;

DENSITY FUNCTIONAL THEORY;

EID: 84897972456     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.02.127     Document Type: Article

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