Tip-sample distance dependency of non-contact atomic force microscopy images on a GaAs(110) surface

Nanotechnology

Volumn 15, Issue 2, 2004, Pages

  Uehara, Nobutomo ^a   Hosoi, Hirotaka ^b   Sueoka, Kazuhisa ^a   Mukasa, Koichi ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DANGLING BOND; NONCONTACT ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; ATOMS; CHEMICAL BONDS; ELECTRON ENERGY LEVELS; MOLECULAR DYNAMICS; NEGATIVE IONS; POSITIVE IONS; SEMICONDUCTING SILICON; ULTRAHIGH VACUUM; VACUUM APPLICATIONS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 1442360644     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/2/020     Document Type: Article

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