-
1
-
-
84871645528
-
-
Du, L.; Wu, C.; Liu, Q.; Huang, L.; Wang, P. Biosens. Bioelectron. 2013, 42, 570-80
-
(2013)
Biosens. Bioelectron.
, vol.42
, pp. 570-580
-
-
Du, L.1
Wu, C.2
Liu, Q.3
Huang, L.4
Wang, P.5
-
4
-
-
84877020840
-
-
Pilolli, R.; Monaci, L.; Visconti, A. TrAC, Trends Anal. Chem. 2013, 47, 12-26
-
(2013)
TrAC, Trends Anal. Chem.
, vol.47
, pp. 12-26
-
-
Pilolli, R.1
Monaci, L.2
Visconti, A.3
-
6
-
-
78651308082
-
-
Tarasov, A.; Fu, W.; Knopfmacher, O.; Brunner, J.; Calame, M.; Schönenberger, C. Appl. Phys. Lett. 2011, 98, 012114
-
(2011)
Appl. Phys. Lett.
, vol.98
, pp. 012114
-
-
Tarasov, A.1
Fu, W.2
Knopfmacher, O.3
Brunner, J.4
Calame, M.5
Schönenberger, C.6
-
7
-
-
84868699299
-
-
Weiss, N. O.; Zhou, H.; Liao, L.; Liu, Y.; Jiang, S.; Huang, Y.; Duan, X. Adv. Mater. 2012, 24, 5782-825
-
(2012)
Adv. Mater.
, vol.24
, pp. 5782-5825
-
-
Weiss, N.O.1
Zhou, H.2
Liao, L.3
Liu, Y.4
Jiang, S.5
Huang, Y.6
Duan, X.7
-
8
-
-
84867608734
-
-
Lee, M.-G.; Lucero, A.; Kim, J.-Y. Trans. Electr. Electron. Mater. 2012, 13, 165-170
-
(2012)
Trans. Electr. Electron. Mater.
, vol.13
, pp. 165-170
-
-
Lee, M.-G.1
Lucero, A.2
Kim, J.-Y.3
-
9
-
-
84877073291
-
-
Justino, C. I. L.; Rocha-Santos, T. a. P.; Cardoso, S.; Duarte, A. C. TrAC, Trends Anal. Chem. 2013, 47, 27-36
-
(2013)
TrAC, Trends Anal. Chem.
, vol.47
, pp. 27-36
-
-
Justino, C.I.L.1
Rocha-Santos A. T, P.2
Cardoso, S.3
Duarte, A.C.4
-
10
-
-
84860842442
-
-
Yang, X.; Frensley, W. R.; Zhou, D.; Member, S. IEEE Trans. Nanotechnol. 2012, 11, 501-512
-
(2012)
IEEE Trans. Nanotechnol.
, vol.11
, pp. 501-512
-
-
Yang, X.1
Frensley, W.R.2
Zhou, D.3
Member, S.4
-
13
-
-
84885312309
-
-
Wang, Y.; Wang, T.; Da, P.; Xu, M.; Wu, H.; Zheng, G. Adv. Mater. 2013, 25, 5177-95
-
(2013)
Adv. Mater.
, vol.25
, pp. 5177-5195
-
-
Wang, Y.1
Wang, T.2
Da, P.3
Xu, M.4
Wu, H.5
Zheng, G.6
-
14
-
-
33846695595
-
-
Stern, E.; Klemic, J. F.; Routenberg, D. a; Wyrembak, P. N.; Turner-Evans, D. B.; Hamilton, A. D.; LaVan, D. a; Fahmy, T. M.; Reed, M. a Nature 2007, 445, 519-22
-
(2007)
Nature
, vol.445
, pp. 519-522
-
-
Stern, E.1
Klemic, J.F.2
Routenberg, D.A.3
Wyrembak, P.N.4
Turner-Evans, D.B.5
Hamilton, A.D.6
Lavan, D.A.7
Fahmy, T.M.8
Reed, M.A.9
-
15
-
-
27144513329
-
-
Zheng, G.; Patolsky, F.; Cui, Y.; Wang, W. U.; Lieber, C. M. Nat. Biotechnol. 2005, 23, 1294-301
-
(2005)
Nat. Biotechnol.
, vol.23
, pp. 1294-1301
-
-
Zheng, G.1
Patolsky, F.2
Cui, Y.3
Wang, W.U.4
Lieber, C.M.5
-
16
-
-
33745686449
-
-
Patolsky, F.; Zheng, G.; Lieber, C. M. Anal. Chem. 2006, 78, 4260-4269
-
(2006)
Anal. Chem.
, vol.78
, pp. 4260-4269
-
-
Patolsky, F.1
Zheng, G.2
Lieber, C.M.3
-
17
-
-
77955574746
-
-
Zheng, G.; Gao, X. P. a; Lieber, C. M. Nano Lett. 2010, 10, 3179-83
-
(2010)
Nano Lett.
, vol.10
, pp. 3179-3183
-
-
Zheng, G.1
Gao, X.P.A.2
Lieber, C.M.3
-
18
-
-
61849125278
-
-
Poghossian, a; Ingebrandt, S.; Offenhäusser, a; Schöning, M. J. Semin. Cell Dev. Biol. 2009, 20, 41-8
-
(2009)
Semin. Cell Dev. Biol.
, vol.20
, pp. 41-48
-
-
Poghossian, A.1
Ingebrandt, S.2
Offenhäusser, A.3
Schöning, M.J.4
-
19
-
-
84862824166
-
-
Kong, T.; Su, R.; Zhang, B.; Zhang, Q.; Cheng, G. Biosens. Bioelectron. 2012, 34, 267-272
-
(2012)
Biosens. Bioelectron.
, vol.34
, pp. 267-272
-
-
Kong, T.1
Su, R.2
Zhang, B.3
Zhang, Q.4
Cheng, G.5
-
20
-
-
16844379309
-
-
Ingebrandt, S.; Yeung, C.-K.; Krause, M.; Offenhäusser, A. Eur. Biophys. J. 2005, 34, 144-54
-
(2005)
Eur. Biophys. J.
, vol.34
, pp. 144-154
-
-
Ingebrandt, S.1
Yeung, C.-K.2
Krause, M.3
Offenhäusser, A.4
-
22
-
-
77953026396
-
-
Rajan, N. K.; Routenberg, D. A.; Chen, J.; Reed, M. A. IEEE Electron Device Lett. 2010, 31, 615-617
-
(2010)
IEEE Electron Device Lett.
, vol.31
, pp. 615-617
-
-
Rajan, N.K.1
Routenberg, D.A.2
Chen, J.3
Reed, M.A.4
-
23
-
-
84866338413
-
-
Shirak, O.; Shtempluck, O.; Kotchtakov, V.; Bahir, G.; Yaish, Y. E. Nanotechnology 2012, 23, 395202
-
(2012)
Nanotechnology
, vol.23
, pp. 395202
-
-
Shirak, O.1
Shtempluck, O.2
Kotchtakov, V.3
Bahir, G.4
Yaish, Y.E.5
-
24
-
-
79960094235
-
-
Rajan, N. K.; Routenberg, D. a; Reed, M. a Appl. Phys. Lett. 2011, 98, 264107-2641073
-
(2011)
Appl. Phys. Lett.
, vol.98
, pp. 264107-2641073
-
-
Rajan, N.K.1
Routenberg, D.A.2
Reed, M.A.3
-
25
-
-
76749108603
-
-
Gao, X. P. a; Zheng, G.; Lieber, C. M. Nano Lett. 2010, 10, 547-52
-
(2010)
Nano Lett.
, vol.10
, pp. 547-552
-
-
Gao, X.P.A.1
Zheng, G.2
Lieber, C.M.3
-
26
-
-
84857448714
-
-
Fernandes, P. G.; Chapman, R. A.; Seitz, O.; Stiegler, H. J.; Wen, H.; Chabal, Y. J.; Vogel, E. M. IEEE Electron Device Lett. 2012, 33, 447-449
-
(2012)
IEEE Electron Device Lett.
, vol.33
, pp. 447-449
-
-
Fernandes, P.G.1
Chapman, R.A.2
Seitz, O.3
Stiegler, H.J.4
Wen, H.5
Chabal, Y.J.6
Vogel, E.M.7
-
27
-
-
0442311975
-
-
Daugé, F.; Pretet, J.; Cristoloveanu, S.; Vandooren, a.; Mathew, L.; Jomaah, J.; Nguyen, B.-Y. Solid. State. Electron. 2004, 48, 535-542
-
(2004)
Solid. State. Electron.
, vol.48
, pp. 535-542
-
-
Daugé, F.1
Pretet, J.2
Cristoloveanu, S.3
Vandooren, A.4
Mathew, L.5
Jomaah, J.6
Nguyen, B.-Y.7
-
28
-
-
29144437780
-
-
Lukyanchikova, N.; Garbar, N.; Smolanka, a.; Lokshin, M.; Simoen, E.; Claeys, C. J. Appl. Phys. 2005, 98, 114506
-
(2005)
J. Appl. Phys.
, vol.98
, pp. 114506
-
-
Lukyanchikova, N.1
Garbar, N.2
Smolanka, A.3
Lokshin, M.4
Simoen, E.5
Claeys, C.6
-
29
-
-
84894164487
-
-
Tianjin, China, Nov 17-18, 2011; IEEE, ISBN: 978-1-4577-1998-1.
-
Ohata, A.; Bae, Y.; Fenouillet-Beranger, C.; Cristoloveanu, S. In 2011 IEEE International Conference of Electron Devices and Solid-State Circuits, Tianjin, China, Nov 17-18, 2011; IEEE, 2011; ISBN: 978-1-4577-1998-1.
-
(2011)
2011 IEEE International Conference of Electron Devices and Solid-State Circuits
-
-
Ohata, A.1
Bae, Y.2
Fenouillet-Beranger, C.3
Cristoloveanu, S.4
-
32
-
-
80052754588
-
-
Toronto, Canada, June 12-16, 2011; IEEE, ISBN: 978-1-4577-0189-4
-
Pud, S.; Li, J.; Petrychuk, M.; Feste, S.; Offenhausser, A.; Mantl, S.; Vitusevich, S. In 2011 21st International Conference on Noise and Fluctuations, Toronto, Canada, June 12-16, 2011; IEEE, 2011; pp 242-245; ISBN: 978-1-4577-0189-4.
-
(2011)
2011 21st International Conference on Noise and Fluctuations
, pp. 242-245
-
-
Pud, S.1
Li, J.2
Petrychuk, M.3
Feste, S.4
Offenhausser, A.5
Mantl, S.6
Vitusevich, S.7
-
33
-
-
0025398785
-
-
Hung, K. K.; Ko, P. K.; Hu, C.; Cheng, Y. C. IEEE Trans. Electron Devices 1990, 37, 654-665
-
(1990)
IEEE Trans. Electron Devices
, vol.37
, pp. 654-665
-
-
Hung, K.K.1
Ko, P.K.2
Hu, C.3
Cheng, Y.C.4
-
34
-
-
44349173098
-
-
Zafari, L.; Jomaah, J.; Ghibaudo, G. Fluct. Noise Lett. 2008, 8, 87-94
-
(2008)
Fluct. Noise Lett.
, vol.8
, pp. 87-94
-
-
Zafari, L.1
Jomaah, J.2
Ghibaudo, G.3
-
35
-
-
84870594336
-
-
Theodorou, C. G.; Ioannidis, E. G.; Haendler, S.; Planes, N.; Arnaud, F.; Jomaah, J.; Dimitriadis, C. A.; Ghibaudo, G.; Neel, P. L. Proc. Eur. Solid-State Device Res. Conf. 2012, 2, 334-337
-
(2012)
Proc. Eur. Solid-State Device Res. Conf.
, vol.2
, pp. 334-337
-
-
Theodorou, C.G.1
Ioannidis, E.G.2
Haendler, S.3
Planes, N.4
Arnaud, F.5
Jomaah, J.6
Dimitriadis, C.A.7
Ghibaudo, G.8
Neel, P.L.9
|