Modeling and simulation of coupling effect on low frequency noise in advanced SOI mosfets

Fluctuation and Noise Letters

Volumn 8, Issue 1, 2008, Pages

  Zafari, Leily ^a   Jomaah, Jalal ^a   Ghibaudo, Gerard ^a  

^a IMEP LAHC   (France)

Author keywords

Double gate; Fully depleted; LF noise; MOSFET; SOI

Indexed keywords

EID: 44349173098     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219477508004325     Document Type: Article

References (15)

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