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Journal of Solid State Electrochemistry

Volumn 17, Issue 12, 2013, Pages 2979-2987

Nanoscale intermittent contact-scanning electrochemical microscopy

(5) Lazenby, Robert A a McKelvey, Kim a,b Peruffo, Massimo a Baghdadi, Marc a,b Unwin, Patrick R a

a UNIVERSITY OF WARWICK (United Kingdom)

b UNIVERSITY OF WARWICK (United Kingdom)

Author keywords

Focused ion beam (FIB) milling; Nanoelectrode; Nanoscale electrochemical imaging; SECM

Indexed keywords

ACTUATORS; ELECTRODES; FEEDBACK; FOCUSED ION BEAMS; GLASS; INTEGRATED CIRCUITS; MILLING (MACHINING); NANOTECHNOLOGY; PLATINUM; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

FINITE ELEMENT METHOD SIMULATION; FOCUSED ION BEAM MILLING; NANO SCALE; NANOELECTRODE; OSCILLATION AMPLITUDE; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; STEADY-STATE VOLTAMMETRY;

ANALYTIC EQUIPMENT;

EID: 84892369102 PISSN: 14328488 EISSN: None Source Type: Journal
DOI: 10.1007/s10008-013-2168-2 Document Type: Article

Times cited : (21)

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