Erratum: Scanning electrochemical microscopy with slightly recessed nanotips (Analytical Chemistry (2007) 79 (5809-5816)) DOI: 10.1021/ac070771m);Scanning electrochemical microscopy with slightly recessed nanotips

Analytical Chemistry

Volumn 79, Issue 15, 2007, Pages 5809-5816

  Sun, Peng ^a   Mirkin, Michael V ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ETCHING; INSULATING MATERIALS; PLATINUM; SCANNING ELECTRON MICROSCOPY; VOLTAMMETRY;

CYLINDRICAL CAVITY; GLASS SHEATH; INSULATING SUBSTRATE; SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);

NANOTIPS;

GLASS; NANOPARTICLE; PLATINUM;

ANALYTIC METHOD; ARTICLE; ELECTRODE; POTENTIOMETRY; QUANTITATIVE ANALYSIS; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE PROPERTY; THEORETICAL STUDY;

EID: 34547796794     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac202917r     Document Type: Erratum

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