Atomic force microscopy of electrochemical nanoelectrodes

Analytical Chemistry

Volumn 84, Issue 12, 2012, Pages 5192-5197

  Nogala, Wojciech ^a   Velmurugan, Jeyavel ^a   Mirkin, Michael V ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGE; ELECTROCHEMICAL PROBE; ELECTROCHEMICAL RESPONSE; ELECTRODE GEOMETRIES; ELECTRODE SHAPE; IN-SITU; NANO SCALE; NANO-ELECTRODES;

SURFACE REACTIONS; VISUALIZATION;

ATOMIC FORCE MICROSCOPY;

EID: 84862535676     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac300744t     Document Type: Article

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