Examining ultramicroelectrodes for scanning electrochemical microscopy by white light vertical scanning interferometry and filling recessed tips by electrodeposition of gold

Analytical Chemistry

Volumn 84, Issue 11, 2012, Pages 5159-5163

  Chang, Jinho ^a   Leonard, Kevin C ^a   Cho, Sung Ki ^a   Bard, Allen J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSE DISTANCE; FAST KINETICS; GOLD ELECTRODES; NANOMETER RESOLUTIONS; SCANNING ELECTROCHEMICAL MICROSCOPY; TOPOGRAPHIC INFORMATION; ULTRA MICROELECTRODES; VERTICAL SCANNING INTERFEROMETRIES; WHITE LIGHT;

ELECTRODEPOSITION; INTERFEROMETRY; MICROELECTRODES; PROFILOMETRY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

GOLD;

EID: 84861861673     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac300863r     Document Type: Article

References (9)

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