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Volumn 74, Issue 15, 2002, Pages 3634-3643
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Combined scanning electrochemical/optical microscopy with shear force and current feedback
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Author keywords
[No Author keywords available]
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Indexed keywords
SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);
SHEAR FORCE;
ELECTROCHEMICAL ELECTRODES;
OPTICAL FIBERS;
OPTICAL MICROSCOPY;
ELECTROCHEMISTRY;
GOLD;
ANIMAL CELL;
ARTICLE;
CELL CULTURE;
ELECTROCHEMISTRY;
FEEDBACK SYSTEM;
MICROSCOPY;
NONHUMAN;
OPTICS;
SCANNING ELECTROCHEMICAL MICROSCOPY;
SHEAR STRESS;
ARTIFICIAL MEMBRANE;
ATOMIC FORCE MICROSCOPY;
CELL MEMBRANE;
CHEMISTRY;
CYTOLOGY;
DIATOM;
INSTRUMENTATION;
METHODOLOGY;
SURFACE PROPERTY;
CELL MEMBRANE;
CYTOLOGICAL TECHNIQUES;
DIATOMS;
FEEDBACK;
MEMBRANES, ARTIFICIAL;
MICROSCOPY, ATOMIC FORCE;
SURFACE PROPERTIES;
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EID: 0036682616
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac015713u Document Type: Article |
Times cited : (113)
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References (34)
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