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Volumn 74, Issue 15, 2002, Pages 3634-3643

Combined scanning electrochemical/optical microscopy with shear force and current feedback

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING ELECTROCHEMICAL MICROSCOPY (SECM); SHEAR FORCE;

EID: 0036682616     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac015713u     Document Type: Article
Times cited : (113)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.