Development of a phase-controlled constant-distance scanning electrochemical microscope

Analytical Chemistry

Volumn 81, Issue 9, 2009, Pages 3654-3659

  Cougnon, Charles ^a   Bauer Espindola, Klaus ^b   Fabre, Dimitri S ^c   Mauzeroll, Janine ^c  

^a UNIVERSITÉ DU MAINE   (France)

^b HEKA Elektronik Dr Schulze GmbH   (Germany)

^c UNIVERSITÉ DU QUÉBEC À MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK MECHANISMS; FORCE CONSTANTS; SCANNING ELECTROCHEMICAL MICROSCOPES; SUBSTRATE DISTANCE;

ANALYTIC EQUIPMENT; MICROSCOPES;

SCANNING;

ARTICLE; CHEMICAL INTERACTION; ELECTRODE; FEEDBACK SYSTEM; SCANNING ELECTROCHEMICAL MICROSCOPY; SHEAR STRENGTH; SPECTRAL SENSITIVITY;

EID: 66149144339     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac802211u     Document Type: Article

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