Nanoscale imaging of surface topography and reactivity with the scanning electrochemical microscope

Analytical Chemistry

Volumn 81, Issue 8, 2009, Pages 3143-3150

  Laforge, François O ^a,b   Velmurugan, Jeyavel ^a   Wang, Yixian ^a   Mirkin, Michael V ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b PRINCETON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT DISCS; COMPUTER CHIPS; CONSTANT CURRENTS; ELECTROCHEMICAL REACTIVITIES; FAST MASS TRANSFERS; FEEDBACK MODES; HIGH QUALITIES; MICRO-METER SCALE; NANO-ELECTRODES; NANO-SCALE IMAGING; NANOPIPETS; NANOSCALE RESOLUTIONS; SCANNING ELECTRO CHEMICAL MICROSCOPES; SCANNING ELECTROCHEMICAL MICROSCOPIES; SIMULTANEOUS IMAGING; STEADY-STATE CONDITIONS; SURFACE REACTIVITIES; TOPOGRAPHIC IMAGING; VARIOUS SUBSTRATES;

ANALYTIC EQUIPMENT; ENGINEERING GEOLOGY; INTEGRATED CIRCUITS; IONIC LIQUIDS; IONIZATION OF LIQUIDS; NANOSTRUCTURED MATERIALS; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; THICKNESS MEASUREMENT;

SURFACE TOPOGRAPHY;

GOLD; IMIDE; IONIC LIQUID; PLASTIC;

ARTICLE; CHEMICAL REACTION; COMPACT DISK; COMPUTER; ELECTRODE; HEIGHT; NANOIMAGING; NANOPIPETTE; SCANNING ELECTROCHEMICAL MICROSCOPY; STEADY STATE; SURFACE PROPERTY;

EID: 65249129788     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac900335c     Document Type: Article

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