Intermittent contact-scanning electrochemical microscopy (IC-SECM): A new approach for tip positioning and simultaneous imaging of interfacial topography and activity

Analytical Chemistry

Volumn 82, Issue 15, 2010, Pages 6334-6337

  McKelvey, Kim ^a,b   Edwards, Martin A ^a,b   Unwin, Patrick R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMPEROMETRIC; CLOSED LOOPS; FEEDBACK APPROACH; FEEDBACK SIGNAL; GLASS SUBSTRATES; GOLD BANDS; INTERFACIAL TOPOGRAPHY; INTERMITTENT-CONTACTS; NEW APPROACHES; OSCILLATION AMPLITUDE; POSITIONING METHODS; PT-DISK; SCANNING ELECTROCHEMICAL MICROSCOPY; SIMULTANEOUS IMAGING; SUBSTRATE SURFACE;

ANALYTIC EQUIPMENT; PLATINUM; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SURFACE TOPOGRAPHY; TOPOGRAPHY;

SUBSTRATES;

EID: 77955139507     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac101099e     Document Type: Conference Paper

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