메뉴 건너뛰기




Volumn , Issue , 2008, Pages 293-335

Multi-gate MOSFET circuit design

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84892351665     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-71752-4_7     Document Type: Chapter
Times cited : (5)

References (35)
  • 3
    • 28144436750 scopus 로고    scopus 로고
    • Ambient intelligence: Gigascale dreams and nanoscale realities
    • H. De Man: Ambient Intelligence: Gigascale Dreams and Nanoscale Realities, ISSCC Dig. Techn. Papers, 29 (2005).
    • (2005) ISSCC Dig. Techn. Papers , pp. 29
    • De Man, H.1
  • 6
    • 33748614600 scopus 로고    scopus 로고
    • Advanced high-k dielectric stacks with polysi and metal gates: Recent progress and current challenges
    • E.P. Gusev, V. Narayanan, M. M. Frank: Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges. IBM Journal of Research and Development 50-4/5, 387 (2006).
    • (2006) IBM Journal of Research and Development , vol.50 , Issue.4-5 , pp. 387
    • Gusev, E.P.1    Narayanan, V.2    Frank, M.M.3
  • 10
    • 0031275325 scopus 로고    scopus 로고
    • Predicting cmos speed with gate oxide and voltage scaling and interconnect loading effects
    • K. Chen, C. Hu, P. Fang, M.R. Lin, D.L. Wollesen: Predicting CMOS Speed with Gate Oxide and Voltage Scaling and Interconnect Loading Effects. IEEE Trans. Electron Dev. 44-11, 1951(1997).
    • (1997) IEEE Trans. Electron Dev , vol.44 , Issue.11 , pp. 1951
    • Chen, K.1    Hu, C.2    Fang, P.3    Lin, M.R.4    Wollesen, D.L.5
  • 21
    • 0029701860 scopus 로고    scopus 로고
    • Impact of transistor mismatch on the speedaccuracy-power trade-off of analog cmos circuits
    • P. Kinget and M. Steyaert: Impact of transistor mismatch on the speedaccuracy-power trade-off of analog CMOS circuits. Proc. IEEE Custom Integrated Circuits Conf., 333 (1996).
    • (1996) Proc. IEEE Custom Integrated Circuits Conf , pp. 333
    • Kinget, P.1    Steyaert, M.2
  • 34
    • 0035335392 scopus 로고    scopus 로고
    • A new model for thermal channel noise of deep-submicron mosfets and its application in rf-cmos design
    • G. Knoblinger, P. Klein and M. Tiebout: A New Model for Thermal Channel Noise of Deep-Submicron MOSFETS and its Application in RF-CMOS Design. IEEE Journal of Solid-State Circuits 36, 831 (2001).
    • (2001) IEEE Journal of Solid-State Circuits , vol.36 , pp. 831
    • Knoblinger, G.1    Klein, P.2    Tiebout, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.