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Volumn , Issue , 2006, Pages 311-314

Self heating simulation of multi-gate FETs

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; MATHEMATICAL MODELS; SPECIFIC HEAT;

EID: 34250672597     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDER.2006.307700     Document Type: Conference Paper
Times cited : (20)

References (7)
  • 3
    • 0025512595 scopus 로고
    • Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling
    • Nov
    • G. K. Wachutka, "Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling," IEEE Transactions on Computer-Aided Design, vol. 9, no. 11, pp. 1141-1149, Nov. 1990.
    • (1990) IEEE Transactions on Computer-Aided Design , vol.9 , Issue.11 , pp. 1141-1149
    • Wachutka, G.K.1
  • 4
    • 84943202387 scopus 로고    scopus 로고
    • ISE TCAD Release 10.0, Integrated Systems Engineering AG, 2004
    • ISE TCAD Release 10.0, Integrated Systems Engineering AG, 2004.
  • 6
    • 0027187550 scopus 로고
    • Thermal resistance evaluation in 3-D thermal simulation of MOSFET transistors
    • Jan
    • I. Hirsch, E. Berman, and N. Haik, "Thermal resistance evaluation in 3-D thermal simulation of MOSFET transistors," Solid-State Electronics, vol. 36, no. 1, pp. 106-108, Jan. 1993.
    • (1993) Solid-State Electronics , vol.36 , Issue.1 , pp. 106-108
    • Hirsch, I.1    Berman, E.2    Haik, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.