Shear stress measurements on InAs nanowires by AFM manipulation

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Volumn 3, Issue 8, 2007, Pages 1398-1401

  Bordag, Michael ^a,b   Ribayrol, Aline ^c   Conache, Gabriela ^b,c   Fröberg, Linus E ^c   Gray, Struan ^c   Samuelson, Lars ^c   Montelius, Lars ^c   Pettersson, Hakan ^b,c  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b HALMSTAD UNIVERSITY   (Sweden)

^c LUND UNIVERSITY   (Sweden)

Author keywords

Atomic force microscopy; Deformation; Indium arsenide; Nanowires

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC DEFORMATION; INDIUM ARSENIDE; PHASE EQUILIBRIA; SHEAR STRESS; SILICA;

COUNTERBALANCING STATIC FRICTION FORCES; ELASTIC FORCE RESTORTION;

NANOWIRES;

INDIUM; INDIUM ARSENIDE; NANOTUBE; ORGANOARSENIC DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELASTICITY; ELECTRICITY; MACROMOLECULE; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; MICROMANIPULATION; NANOTECHNOLOGY; PARTICLE SIZE; SHEAR STRENGTH; SURFACE PROPERTY; ULTRASTRUCTURE;

ARSENICALS; CRYSTALLIZATION; ELASTICITY; ELECTRIC WIRING; INDIUM; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES; PARTICLE SIZE; SHEAR STRENGTH; STRESS, MECHANICAL; SURFACE PROPERTIES;

EID: 34547850195     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200700052     Document Type: Article

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