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Volumn 13, Issue 11, 2013, Pages 5106-5111

Three-dimensional atomic force microscopy: Interaction force vector by direct observation of tip trajectory

Author keywords

3D; AFM; back scattered; lateral; normal; pointing noise

Indexed keywords

3D; AFM; BACK-SCATTERED; LATERAL; NORMAL;

EID: 84887836238     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl403423p     Document Type: Article
Times cited : (10)

References (34)
  • 28
    • 84887831746 scopus 로고    scopus 로고
    • John Wiley and Sons, Inc. New York
    • see Paul, W. J. Mechanical Vibration; John Wiley and Sons, Inc.: New York, 2007.
    • (2007) Mechanical Vibration
    • Paul, W.J.1
  • 30


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.