Independent measurements of force and position in atomic force microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7405, Issue , 2009, Pages

  Churnside, Allison B ^a   King, Gavin M ^a   Perkins, Thomas T ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

Atomic force microscopy; Force spectroscopy; Scanning probe microscopy; Single molecule

Indexed keywords

AFM; AFM TIP; AMBIENT CONDITIONS; ATOMIC FORCE MICROSCOPES; ATOMIC SCALE; CANTILEVER DEFLECTION; DETECTION TECHNIQUE; FIDUCIAL MARK; FORCE SPECTROSCOPY; INDEPENDENT MEASUREMENT; MECHANICAL DRIFT; NANOFABRICATION; OPTICAL LEVER; REFERENCE FRAME; SAMPLE POSITION; SINGLE MOLECULE; SINGLE MOLECULE FORCE SPECTROSCOPY; THREE DIMENSIONS; UNSOLVED PROBLEMS; VERTICAL CONTROL; VERTICAL POSITIONS;

ATOMIC FORCE MICROSCOPY; ATOMS; INSTRUMENTS; MOLECULES; NANOCANTILEVERS; PROBES; STANDARDS;

ATOMIC SPECTROSCOPY;

EID: 70449635647     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.826567     Document Type: Conference Paper

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