-
3
-
-
36549096102
-
Novel optical approach to atomic force microscopy
-
Meyer G and Amer N M 1988 Novel optical approach to atomic force microscopy Appl. Phys. Lett. 53 1045-7
-
(1988)
Appl. Phys. Lett.
, vol.53
, Issue.12
, pp. 1045-1047
-
-
Meyer, G.1
Amer, N.M.2
-
4
-
-
12044259475
-
Breaking the diffraction barrier-optical microscopy on a nanometric scale
-
Betzig E, Trautman J K, Harris T D, Weiner J S and Kostelak R L 1991 Breaking the diffraction barrier-optical microscopy on a nanometric scale Science 251 1468-70
-
(1991)
Science
, vol.251
, Issue.5000
, pp. 1468-1470
-
-
Betzig, E.1
Trautman, J.K.2
Harris, T.D.3
Weiner, J.S.4
Kostelak, R.L.5
-
5
-
-
21544436741
-
Combined shear force and near-field scanning optical microscopy
-
Betzig E, Finn P L and Weiner J S 1992 Combined shear force and near-field scanning optical microscopy Appl. Phys. Lett. 60 2484-6
-
(1992)
Appl. Phys. Lett.
, vol.60
, Issue.20
, pp. 2484-2486
-
-
Betzig, E.1
Finn, P.L.2
Weiner, J.S.3
-
6
-
-
0028531602
-
Minimum detectable displacement in near-field scanning optical microscopy
-
Froehlich F F and Milster T D 1994 Minimum detectable displacement in near-field scanning optical microscopy Appl. Phys. Lett. 65 2254-6
-
(1994)
Appl. Phys. Lett.
, vol.65
, Issue.18
, pp. 2254-2256
-
-
Froehlich, F.F.1
Milster, T.D.2
-
7
-
-
0000990214
-
A new method to measure the oscillation of a cylindrical cantilever: 'The laser reflection detection system'
-
Antognozzi M, Haschke H and Miles M J 2000 A new method to measure the oscillation of a cylindrical cantilever: 'the laser reflection detection system' Rev. Sci. Instrum. 71 1689-94
-
(2000)
Rev. Sci. Instrum.
, vol.71
, Issue.4
, pp. 1689-1694
-
-
Antognozzi, M.1
Haschke, H.2
Miles, M.J.3
-
8
-
-
0036385032
-
Comparison between shear force and tapping mode AFM-high resolution imaging of DNA
-
Antognozzi M, Szczelkun M D, Round A N and Miles M J 2002 Comparison between shear force and tapping mode AFM-high resolution imaging of DNA Single Mol. 3 104-9
-
(2002)
Single Mol.
, vol.3
, Issue.2-3
, pp. 105-109
-
-
Antognozzi, M.1
Szczelkun, M.D.2
Round, A.N.3
Miles, M.J.4
-
9
-
-
0034668613
-
Interfacial shear force microscopy
-
Karrai K and Tiemann I 2000 Interfacial shear force microscopy Phys. Rev. B 62 13174-81
-
(2000)
Phys. Rev.
, vol.62
, Issue.19
, pp. 13174-13181
-
-
Karrai, K.1
Tiemann, I.2
-
10
-
-
0033204975
-
Measurement of colloidal forces with TIRM
-
Prieve D C 1999 Measurement of colloidal forces with TIRM Adv. Colloid Interface Sci. 82 93-125
-
(1999)
Adv. Colloid Interface Sci.
, vol.82
, Issue.1-3
, pp. 93-125
-
-
Prieve, D.C.1
-
11
-
-
4444347377
-
Atomic force microscopy colloid-probe measurements with explicit measurement of particle-solid separation
-
Clark S C, Walz J Y and Ducker W A 2004 Atomic force microscopy colloid-probe measurements with explicit measurement of particle-solid separation Langmuir 20 7616-22
-
(2004)
Langmuir
, vol.20
, Issue.18
, pp. 7616-7622
-
-
Clark, S.C.1
Walz, J.Y.2
Ducker, W.A.3
-
12
-
-
21644462350
-
Relationship between scattered intensity and separation for particles in an evanescent field
-
McKee C T, Clark S C, Walz J Y and Ducker W A 2005 Relationship between scattered intensity and separation for particles in an evanescent field Langmuir 21 5783-9
-
(2005)
Langmuir
, vol.21
, Issue.13
, pp. 5783-5789
-
-
McKee, C.T.1
Clark, S.C.2
Walz, J.Y.3
Ducker, W.A.4
-
13
-
-
39749088286
-
Diffraction of evanescent waves and nanomechanical displacement detection
-
Karabacak D M, Ekinci K L, Gan C H, Gbur G J, Ü nlü M S, Ippolito S B, Goldberg B B and Carney P S 2007 Diffraction of evanescent waves and nanomechanical displacement detection Opt. Lett. 32 1881-3
-
(2007)
Opt. Lett.
, vol.32
, Issue.13
, pp. 1881-1883
-
-
Karabacak, D.M.1
Ekinci, K.L.2
Gan, C.H.3
Gbur, G.J.4
Ünlü, M.S.5
Ippolito, S.B.6
Goldberg, B.B.7
Carney, P.S.8
-
14
-
-
0033104987
-
Three-dimensional high-resolution particle tracking for optical tweezers by forward scattered light
-
Pralle A, Prummer M, Florin E L, Stelzer E H K and Horber J K H 1999 Three-dimensional high-resolution particle tracking for optical tweezers by forward scattered light Microsc. Res. Tech. 44 378-86
-
(1999)
Microsc. Res. Tech.
, vol.44
, Issue.5
, pp. 378-386
-
-
Pralle, A.1
Prummer, M.2
Florin, E.L.3
Stelzer, E.H.K.4
Horber, J.K.H.5
-
15
-
-
0031904601
-
Two-dimensional tracking of ncd motility by back focal plane interferometry
-
Allersma M W, Gittes F, deCastro M J, Stewart R J and Schmidt C F 1998 Two-dimensional tracking of ncd motility by back focal plane interferometry Biophys. J. 74 1074-85
-
(1998)
Biophys. J.
, vol.74
, Issue.2
, pp. 1074-1085
-
-
Allersma, M.W.1
Gittes, F.2
Decastro, M.J.3
Stewart, R.J.4
Schmidt, C.F.5
-
16
-
-
0027543139
-
Near field optical measurement of the surface plasmon field
-
Marti O, Bielefeldt H, Hecht B, Herminghaus S, Leiderer P and Mlynek J 1993 Near field optical measurement of the surface plasmon field Opt. Commun. 96 225-8
-
(1993)
Opt. Commun.
, vol.96
, Issue.4-6
, pp. 225-228
-
-
Marti, O.1
Bielefeldt, H.2
Hecht, B.3
Herminghaus, S.4
Leiderer, P.5
Mlynek, J.6
-
17
-
-
36449002856
-
Method for the calibration of atomic-force microscope cantilevers
-
Sader J E, Larson I, Mulvaney P and White L R 1995 Method for the calibration of atomic-force microscope cantilevers Rev. Sci. Instrum. 66 3789-98
-
(1995)
Rev. Sci. Instrum.
, vol.66
, Issue.7
, pp. 3789-3798
-
-
Sader, J.E.1
Larson, I.2
Mulvaney, P.3
White, L.R.4
|