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Volumn 19, Issue 38, 2008, Pages

A new detection system for extremely small vertically mounted cantilevers

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; MICROSCOPIC EXAMINATION;

EID: 51349102535     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/38/384002     Document Type: Article
Times cited : (35)

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    • Minimum detectable displacement in near-field scanning optical microscopy
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  • 7
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    • A new method to measure the oscillation of a cylindrical cantilever: 'The laser reflection detection system'
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    • Interfacial shear force microscopy
    • Karrai K and Tiemann I 2000 Interfacial shear force microscopy Phys. Rev. B 62 13174-81
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    • Karrai, K.1    Tiemann, I.2
  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.