Ultrastable atomic force microscopy: Atomic-scale stability and registration in ambient conditions

Nano Letters

Volumn 9, Issue 4, 2009, Pages 1451-1456

  King, Gavin M ^a   Carter, Ashley R ^a   Churnside, Allison B ^a   Eberle, Louisa S ^a,b   Perkins, Thomas T ^a  

^a UNIVERSITY OF COLORADO   (United States)

^b Denver School of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGES; AMBIENT CONDITIONS; ATOMIC FORCES; ATOMIC-FORCE MICROSCOPIES; CRYOGENIC TEMPERATURES; DIMENSIONAL POSITIONS; ENHANCED STABILITIES; IMAGE SIGNALS; LASER POWER; OPERATING ENVIRONMENTS; ROOM TEMPERATURES; SAMPLE SURFACES; SIGNAL-TO-NOISE RATIOS; STABILIZATION TECHNIQUES; TIP-SAMPLE INTERACTIONS; TRANSPARENT SUBSTRATES;

ACOUSTIC INTENSITY; ATOMS; SIGNAL TO NOISE RATIO; STABILITY; THREE DIMENSIONAL; VACUUM;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; COLD; METHODOLOGY; VACUUM;

COLD TEMPERATURE; MICROSCOPY, ATOMIC FORCE; VACUUM;

EID: 65249086684     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl803298q     Document Type: Article

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