Active particle control through silicon using conventional optical trapping techniques

Lab on a Chip

Volumn 7, Issue 12, 2007, Pages 1837-1840

  Appleyard, David C ^a   Lang, Matthew J ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; PARTICULATE MATTER; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 36348975720     PISSN: 14730197     EISSN: 14730189     Source Type: Journal    
DOI: 10.1039/b711507e     Document Type: Article

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