Stabilization of an optical microscope to 0.1 nm in three dimensions

Applied Optics

Volumn 46, Issue 3, 2007, Pages 421-427

  Carter, Ashley R ^a   King, Gavin M ^a,b   Ulrich, Theresa A ^a,d   Halsey, Wayne ^a   Alchenberger, David ^a   Perkins, Thomas T ^a,c  

^a UNIVERSITY OF COLORADO   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c UNIVERSITY OF COLORADO SCHOOL OF MEDICINE   (United States)

^d University of California at Berkeley   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PIEZOELECTRIC DEVICES; STABILIZATION;

ATOMIC SCALE STABILIZATION; BACK FOCAL PLANE (BFP); FIDUCIAL MARK; INDEPENDENT DETECTION LASER; VERTICAL MOTION;

OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER PROGRAM; EQUIPMENT DESIGN; IMAGE PROCESSING; IMAGE SUBTRACTION; INSTRUMENTATION; LASER; METHODOLOGY; MICROMANIPULATION; MICROSCOPY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING; TIME;

ALGORITHMS; EQUIPMENT DESIGN; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; LASERS; MICROMANIPULATION; MICROSCOPY; SENSITIVITY AND SPECIFICITY; SOFTWARE; SUBTRACTION TECHNIQUE; TIME FACTORS;

EID: 33847281331     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000421     Document Type: Article

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