A novel technique for the in situ calibration and measurement of friction with the atomic force microscope

Review of Scientific Instruments

Volumn 76, Issue 8, 2005, Pages 1-9

  Stiernstedt, Johanna ^a,b   Rutland, Mark W ^a,b   Attard, Phil ^c  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b INSTITUTE FOR SURFACE CHEMISTRY   (Sweden)

^c UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; CANTILEVER BEAMS; SCANNING; SENSITIVITY ANALYSIS;

ATOMIC FORCE MICROSCOPE; AXIAL FRICTION FORCE; FORCE MEASUREMENT; PHOTODIODE DETECTOR;

FRICTION;

EID: 26444462128     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2006407     Document Type: Article

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