Interlaboratory round robin on cantilever calibration for AFM force spectroscopy

Ultramicroscopy

Volumn 111, Issue 12, 2011, Pages 1659-1669

  te Riet, Joost ^a,b   Katan, Allard J ^c,i   Rankl, Christian ^d   Stahl, Stefan W ^e   van Buul, Arend M ^a   Phang, In Yee ^f,g,j   Gomez Casado, Alberto ^f   Schön, Peter ^f   Gerritsen, Jan W ^a   Cambi, Alessandra ^b   Rowan, Alan E ^a   Vancso, G Julius ^f,g   Jonkheijm, Pascal ^f   Huskens, Jurriaan ^f   Oosterkamp, Tjerk H ^c   Gaub, Hermann ^e   Hinterdorfer, Peter ^h   Figdor, Carl G ^b   Speller, Sylvia ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b RADBOUD UNIVERSITY MEDICAL CENTER   (Netherlands)

^c LEIDEN UNIVERSITY   (Netherlands)

^d Agilent Technologies Osterrreich GmbH   (Austria)

^e UNIVERSITY OF MUNICH   (Germany)

^f UNIVERSITY OF TWENTE   (Netherlands)

^g DUTCH POLYMER INSTITUTE DPI   (Netherlands)

^h JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

ⁱ LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^j INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

more..

Author keywords

AFM force spectroscopy; Atomic force microscopy; Cantilever calibration; Round robin experiment; Spring constant

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPE (AFM); BIOLOGICAL FORCES; CALIBRATION PROTOCOLS; CANTILEVER CALIBRATION; CANTILEVER SPRINGS; CONSISTENCY CHECKS; FORCE SPECTROSCOPY; OPTIMAL CALIBRATION; PHYSICAL PARAMETERS; ROUND ROBIN; SINGLE MOLECULE FORCE SPECTROSCOPY; SPRING CONSTANTS; V-SHAPED CANTILEVERS;

CALIBRATION; EXPERIMENTS; NANOCANTILEVERS; OPTIMIZATION; SPRINGS (COMPONENTS); THERMAL NOISE;

ATOMIC FORCE MICROSCOPY;

ACCURACY; ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPE; ATOMIC FORCE MICROSCOPY; BIOPHYSICS; CALIBRATION; CANTILEVER; CONSTANTS AND COEFFICIENTS; LABORATORY; LABORATORY DEVICE; MICROSCOPE; NOISE; PROCESS OPTIMIZATION; RELIABILITY; REPRODUCIBILITY; ROUND ROBIN EXPERIMENT; SADER METHOD; SPRING CONSTANT; THERMAL NOISE; ALGORITHM; INSTRUMENTATION; METHODOLOGY; SPECTROSCOPY; STATIC ELECTRICITY; THEORETICAL MODEL;

LIGAND;

ALGORITHMS; CALIBRATION; LIGANDS; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; SPECTRUM ANALYSIS; STATIC ELECTRICITY;

EID: 81055138892     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.09.012     Document Type: Article

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