Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions

Journal of Physical Chemistry B

Volumn 117, Issue 39, 2013, Pages 11885-11892

  Seah, Martin P ^a   Spencer, Steve J ^a   Shard, Alex G ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE DEPENDENCE; ANGLES OF INCIDENCE; DAMAGED MATERIALS; DEPTH RESOLUTION; ORGANIC MATERIALS; SPUTTERING YIELDS; SURFACE NORMALS; UNIVERSAL EQUATION;

ARGON; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ION SOURCES;

EID: 84885141513     PISSN: 15206106     EISSN: 15205207     Source Type: Journal    
DOI: 10.1021/jp408168z     Document Type: Article

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