Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study

Journal of Physical Chemistry B

Volumn 114, Issue 2, 2010, Pages 769-774

  Sjovall P ^a   Rading, D ^b   Ray, S ^c   Yang, L ^c   Shard, A G ^c  

^a SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

^b UNIVERSITY OF MÜNSTER   (Germany)

^c NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COOLING; ROTATION; SPUTTERING;

ADVANCED MATERIALS; DEPTH RESOLUTION; INTERLABORATORY STUDIES; ION YIELDS; MULTI-LAYERED; ORGANIC DEPTH PROFILE; ORGANIC DEPTH PROFILING; ORGANIC MATERIALS; PROFILING DEPTH; QUANTIFICATION METHODS; ROOM TEMPERATURE; SAMPLE COOLING; SAMPLE ROTATION; SPUTTERING YIELDS; TRANSIENT PROCESS;

DEPTH PROFILING;

EID: 75649127299     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9095216     Document Type: Article

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