Depth resolution during C60+ profiling of multilayer molecular films

Analytical Chemistry

Volumn 80, Issue 19, 2008, Pages 7363-7371

  Zheng, Leiliang ^a   Wucher, Andreas ^b   Winograd, Nicholas ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM; FULLERENES; MASS SPECTROMETRY; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; SILICON;

BARIUM ARACHIDATE; DEPTH RESOLUTION; DIMYRISTOYL; FULLERENE; LANGMUIR-BLODGETT; LB MULTILAYERS; PRIMARY IONS; SI SUBSTRATE; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY;

HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;

BARIUM ARACHIDATE; BARIUM DERIVATIVE; BARIUM DIMYRISTOYL PHOSPHATIDATE; FULLERENE; LIQUID NITROGEN; SILICON; UNCLASSIFIED DRUG; ARACHIDIC ACID; FULLERENE DERIVATIVE; ION; PHOSPHATIDIC ACID;

ANALYTIC METHOD; ARTICLE; CHEMICAL COMPOSITION; CONTACT ANGLE; ENERGY; FILM; LOW TEMPERATURE; ROOM TEMPERATURE; TIME OF FLIGHT MASS SPECTROMETRY; CHEMISTRY; MASS SPECTROMETRY; METHODOLOGY; TEMPERATURE;

BARIUM COMPOUNDS; EICOSANOIC ACIDS; FULLERENES; IONS; PHOSPHATIDIC ACIDS; SPECTROMETRY, MASS, SECONDARY ION; TEMPERATURE;

EID: 54749103156     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac801056f     Document Type: Article

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