Structural and chemical studies of metal-organic decomposed La xCeyOz thin film as a catalytic oxide on 4H-SiC as a function of postdeposition annealing time

Journal of Physical Chemistry C

Volumn 117, Issue 27, 2013, Pages 14014-14024

  Lim, Way F ^a   Cheong, Kuan Y ^a  

^a SCHOOL OF MATERIALS AND MINERAL RESOURCES ENGINEERING   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

4H-SIC SUBSTRATE; CROSS-SECTIONAL STUDY; CRYSTALLINE PHASIS; DEPTH-PROFILE ANALYSIS; FIXED TEMPERATURE; INWARD DIFFUSION; POST DEPOSITION ANNEALING; WILLIAMSON-HALL;

METAL ANALYSIS; PHASE INTERFACES; PHOTOELECTRONS; REDOX REACTIONS; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CERIUM;

EID: 84880142639     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp4025975     Document Type: Article

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