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Volumn 423, Issue 1-2 SPEC. ISS., 2006, Pages 107-111

Investigation of epitaxial LaNiO3-x thin films by high-energy XPS

Author keywords

LaNiO3; Photoelectron spectroscopy; Reactive d.c. magnetron sputtering; Synchrotron radiation

Indexed keywords

ELECTRON ENERGY LEVELS; EPITAXIAL GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; HYDROXYLATION; LANTHANUM ALLOYS; MAGNETRON SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33748880649     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2005.12.038     Document Type: Article
Times cited : (194)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.