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Volumn 113, Issue 21, 2013, Pages

Electrode interface control of the Schottky diode-like behavior in epitaxial Pb(Zr0.2Ti0.8)O3 thin films: A critical analysis

(6) Hrib, L M a Boni, A G a Chirila, C a Pasuk, I a Pintilie, I a Pintilie, L a

a NATIONAL INSTITUTE OF MATERIALS PHYSICS (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATION LAYERS; BOTTOM ELECTRODES; CRITICAL DISCUSSIONS; CURRENT-VOLTAGE MEASUREMENTS; ELECTRODE INTERFACE; IV CHARACTERISTICS; POLARIZATION REVERSALS; POTENTIAL BARRIERS;

CONTACTS (FLUID MECHANICS); DIODES; EPITAXIAL GROWTH; FERROELECTRICITY; LEAD; METALS; PLATINUM; POLARIZATION; PULSED LASER DEPOSITION; SCHOTTKY BARRIER DIODES; THIN FILMS;

ZIRCONIUM;

EID: 84879376497 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4808464 Document Type: Article

Times cited : (17)

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