Transient-current measurement of the trap charge density at interfaces of a thin-film metalferroelectricmetal structure

Applied Physics Letters

Volumn 87, Issue 19, 2005, Pages 1-3

  Delimova, L A ^a   Grekhov, I V ^a   Mashovets, D V ^a   Tyaginov, S E ^a   Shin, Sangmin ^b   Koo, June Moo ^b   Kim, Suk Pil ^b   Park, Youngsoo ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CHARGE; FERROELECTRIC THIN FILMS; INTERFACES (MATERIALS); POLARIZATION; REMANENCE; SCHOTTKY BARRIER DIODES;

CHARGE DENSITY; INTERFACE TRAPS; REMNANT POLARIZATION; TRANSIENT-CURRENT MEASUREMENTS;

ELECTRIC CURRENT MEASUREMENT;

EID: 27644505024     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2125122     Document Type: Article

References (17)

1. V. V. Prisedsky, V. I. Shishkovsky, and V. V. Klimov, Ferroelectrics 17, 465 (1978).
2. J. Robertson, W. L. Warren, B. A. Tuttle, D. Dimos, and D. M. Smyth, Appl. Phys. Lett. 63, 1519 (1993).
3. M. V. Raymond and D. M. Smyth, Integr. Ferroelectr. 4, 145 (1994).
4. P. F. Baude, C. Ye, and D. L. Polla, Appl. Phys. Lett. 64, 2670 (1994).
5. T. Mihara and H. Watanabe, Jpn. J. Appl. Phys., Part 1 34, 5664 (1995).
6. H.-M. Chen, J.-M. Lan, J.-L. Chen, and J. Y.-M. Lee, Appl. Phys. Lett. 69, 1743 (1996).
7. T. Nishida, M. Matsuoka, S. Okamura, and T. Shiosaki, Jpn. J. Appl. Phys., Part 1 42, 5947 (2003).
8. L. Delimova, I. Liniichuk, D. Mashovets, I. Titkov, and I. Grekhov, 10th EMF., Cambridge UK, August 2003, J. Conf. Abs. 8, 113.
9. L. Berman and I. Titkov, Semiconductors 38, 683 (2004).
10. L. Delimova, I. Grekhov, D. Mashovets, S. Shin, J.-M. Koo, S.-P. Kim, and Y. Park, Proceedings of the Materials Research Society Fall Meeting, Boston, 2004, Vol. 830.
11. S. L. Miller, J. R. Schwank, R. D. Nasby, and M. S. Rodgers, J. Appl. Phys. 70, 2849 (1991).
12. Y. Watanabe, Phys. Rev. B 57, R5563 (1998-II).
13. I. G. Lang and Y. A. Firsov, Sov. Phys. Solid State 5, 2049 (1963).
14. S. M. Sze, D. J. Coleman, Jr., and A. Loya, Solid-State Electron. 14, 1209 (1971).
15. J. F. Scott, K. Watanabe, A. J. Hartmann, and R. N. Lamb, Ferroelectrics 225, 83 (1999).
16. J. G. Simmons and L. S. Wei, Solid-State Electron. 17, 117 (1974).
17. S. D. Ganichev, W. Prettl, and I. N. Yassievich, Phys. Solid State 39, 1703 (1997).