Dielectric functions and electronic band structure of lead zirconate titanate thin films

Journal of Applied Physics

Volumn 98, Issue 9, 2005, Pages

  Lee, Hosun ^a,b   Kang, Youn Seon ^a   Cho, Sang Jun ^a   Xiao, Bo ^a   Morko̧, Hadis ^a   Kang, Tae Dong ^b   Lee, Ghil Soo ^b   Li, Jingbo ^c   Wei, Su Huai ^c   Snyder, P G ^d   Evans, J T ^e  

^a Virginia Commonwealth University   (United States)

^b Kyung Hee University   (South Korea)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^d UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^e Radiant Technologies Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND-GAP ENERGY; LOCAL-DENSITY APPROXIMATION; PLATINIZED SILICON SUBSTRATES; PSEUDODIELECTRIC FUNCTIONS;

BAND STRUCTURE; DENSITY (SPECIFIC GRAVITY); ELECTRONIC STRUCTURE; FILM GROWTH; PERMITTIVITY; SENSITIVITY ANALYSIS; SILICON; THIN FILMS; ULTRAVIOLET RADIATION; ZIRCONIUM COMPOUNDS;

LEAD COMPOUNDS;

EID: 27844536583     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2128043     Document Type: Article

References (30)

1. K. Uchino, Ferroelectric Devices (Marcel Dekker, New York, 2000).
2. Y. Xu, Ferroelectric Materials and Their Applications (North-Holland, Tokyo, 1991).
3. B. Li, P. T. Lai, G. Q. Li, S. H. Zheng, and M. Q. Hwang, Smart Mater. Struct. 9, 498 (2000).
4. I. K. Yoo, in Ferroelectric Thin Films, edited by, S. Hong, (Kluwer Academic, New York, 2004) p. 3.
5. R. Ramesh, S. Aggarwal, and O. Auciello, Mater. Sci. Eng., R. 32, 191 (2001), and references therein.
6. C. H. Peng, J.-F. Chang, and S. B. Desu, Mater. Res. Soc. Symp. Proc. 243, 21 (1992).
7. S. Yang, D. Mo, and X. Tang, Ferroelectrics 287, 35 (2003).
8. M. P. Moret, M. A. C. Devillers, K. Wörhoff, and P. K. Larsen, J. Appl. Phys. 92, 468 (2002).
9. L. Pintile, I. Boerasu, M. J. M. Gomes, and M. Pereira, Thin Solid Films 458, 114 (2004).
10. I. Boerasu, L. Pintile, M. Pereira, M. I. Vasilevskiy, and M. J. M. Gomes, J. Appl. Phys. 93, 4776 (2003).
11. S. B. Krupanidhi, H. Hu, and V. Kumar, J. Appl. Phys. 71, 376 (1992).
12. S. Dutta, R. N. P. Choudhary, P. K. Sinha, and A. K. Thakur, J. Appl. Phys. 96, 1607 (2004), and references therein.
13. K. W. Kwok, R. C. W. Tsang, H. L. W. Chan, and C. L. Choy, J. Appl. Phys. 95, 1372 (2004).
14. S. Bhaskar, S. B. Majumder, and R. S. Katiyar, Appl. Phys. Lett. 80, 3997 (2002).
15. C. Millon, C. Malhaire, and D. Barbier, Sens. Actuators, A, A 113, 376 (2004).
16. B. Jaffe, W. R. Cook, and H. Jaffe, Piezoelectric Ceramics (Academic, London, 1971).
17. B. Thangaraju and P. Kaliannan, Semicond. Sci. Technol. 15, 542 (2000).
18. D. E. Aspnes, Thin Solid Films 89, 249 (1982).
19. B. Johs, C. M. Herzinger, J. H. Dinan, A. Cornfeld, and J. D. Benson, Thin Solid Films 313/314, 137 (1998).
20. M. Cardona, in Modulation Spectroscopy, Solid State Physics, edited by, F. Seitz, D. Turnbull, and, H. Ehrenreich, (Academic, New York, 1969), p. 65.
21. D. E. Aspnes, Handbook on Semiconductors (North Holland, Amsterdam, 1980), Vol. 2, p. 109.
22. P. Lautenschlager, M. Garriga, L. Viña, and M. Cardona, Phys. Rev. B 36, 4821 (1987), and reference therein.
23. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier Science, New York, 1987).
24. G. H. Haertling, J. Am. Ceram. Soc. 82, 797 (1999).
25. V. I. Zametin, Phys. Status Solidi B 124, 625 (1984).
26. H. Lee, Y. S. Kang, S.-J. Cho, B. Xiao, H. Morko̧, and T. D. Kang, Appl. Phys. Lett. 86, 262902 (2005)..
27. G. Kresse and J. Hafner, Phys. Rev. B 47, 558 (1993).
28. G. Kresse and J. Furthmüller, Phys. Rev. B 54, 11169 (1996).
29. J. Robertson, W. L. Warren, and B. A. Tuttle, J. Appl. Phys. 77, 3975 (1995).
30. R. D. King-Smith and D. Vanderbilt, Phys. Rev. B 49, 5828 (1994).