Polarization dependence of Schottky barrier heights at interfaces of ferroelectrics determined by photoelectron spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 9, 2012, Pages

  Chen, Feng ^a,b   Klein, Andreas ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b HEFEI INSTITUTES OF PHYSICAL SCIENCE   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84866128565     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.094105     Document Type: Article

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