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Volumn 107, Issue 10, 2010, Pages

Interface depolarization field as common denominator of fatigue and size effect in Pb(Zr0.54Ti0.46)O3 ferroelectric thin film capacitors

(5) Bouregba, R a Sama, N b Soyer, C b Poullain, G a Remiens, D b

a UNIVERSITÉ DE CAEN (France)

b INSTITUT D ELECTRONIQUE (France)

Author keywords

[No Author keywords available]

Indexed keywords

AGING PROCESS; BAND GAPS; COERCIVE VALUES; COMMON DENOMINATORS; CONDUCTING OXIDES; DEPOLARIZATION FIELDS; DIELECTRIC PERMITTIVITIES; DOWN-SCALING; ELECTRODE CONFIGURATIONS; FATIGUE CYCLING; FATIGUE MEASUREMENTS; FERROELECTRIC PROPERTY; FERROELECTRIC THIN-FILM CAPACITORS; INTERFACE CHEMISTRY; LARGE TIME CONSTANT; PZT; PZT FILM; SIZE EFFECTS; SPACE CHARGES; THIN-FILM CAPACITORS; TRAP ENERGY LEVELS; UNDERLYING MECHANISM;

CAPACITANCE; CAPACITORS; DEPOLARIZATION; FERROELECTRIC THIN FILMS; FERROELECTRICITY; HYSTERESIS; HYSTERESIS LOOPS; LEAD; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PLATINUM; SEMICONDUCTING LEAD COMPOUNDS; SIZE DETERMINATION; THIN FILM CIRCUITS; ZIRCONIUM;

ELECTROLYTIC CAPACITORS;

EID: 77952970322 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3380837 Document Type: Article

Times cited : (18)

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