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Volumn 59, Issue 24, 1999, Pages 16022-16027

Leakage current mechanisms in lead-based thin-film ferroelectric capacitors

Author keywords

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Indexed keywords


EID: 0038757517     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.16022     Document Type: Article
Times cited : (149)

References (45)
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    • (1996) Ferroelectric Thin Films: Synthesis and Basic Properties , pp. 47-92
    • Waser, R.1    Smyth, D.M.2
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    • J. J. O’Dwyer, (Clarendon, Oxford, 1973), 236–256
    • J. J. O’Dwyer, The Theory of Electrical Conduction and Breakdown in Solid Dielectrics (Clarendon, Oxford, 1973), pp. 236–256.
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    • A. I. Kingon, E. R. Myers, and B. Tuttle, Material Research Society, in, edited by, 243 (, Pittsburgh, p
    • S. E. Bernacki, in Ferroelectric Thin Films II, edited by A. I. Kingon, E. R. Myers, and B. Tuttle, MRS Symposia Proceedings No. 243 (Material Research Society, Pittsburgh, 1992), p. 135.
    • (1992) MRS Symposia Proceedings , pp. 135
    • Bernacki, S.E.1
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    • edited by K.-H. Hellwege and O. Madelung, Landolt-Bornstein, New Series, Group III, 28, Pt. b (Springer-Verlag, Berlin, 1991), 232 and 238
    • Ferroelectrics and Related Substances. Non-Oxides, edited by K.-H. Hellwege and O. Madelung, Landolt-Bornstein, New Series, Group III, Vol. 28, Pt. b (Springer-Verlag, Berlin, 1991), pp. 232 and 238.
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    • (private communication)
    • W. L. Warren (private communication).
    • Warren, W.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.