Intrinsic ferroelectric properties of strained tetragonal PbZr 0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single-crystalline films

Advanced Materials

Volumn 18, Issue 13, 2006, Pages 1657-1661

  Vrejoiu, Ionela ^a   Rhun, Gwenaël Le ^a   Pintilie, Lucian ^a   Hesse, Dietrich ^a   Alexe, Marin ^a   Gösele, Ulrich ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; FERROELECTRICITY; HYSTERESIS; IRON COMPOUNDS; OPTICAL FIBER FABRICATION; PERMITTIVITY; PIEZOELECTRIC DEVICES; POLARIZATION; PULSED LASER DEPOSITION; SEMICONDUCTOR GROWTH; SWITCHING; THIN FILMS;

DEFECT-FREE SINGLE-CRYSTALLINE FILMS; INTRINSIC FERROELECTRIC PROPERTIES; PIEZOELECTRIC HYSTERESIS LOOPS; SQUARE-SHAPE POLARIZATION;

LEAD COMPOUNDS;

EID: 33745831883     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200502711     Document Type: Article

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