Specifications for hard condensed matter specimens for three-dimensional high-resolution tomographies

Microscopy and Microanalysis

Volumn 19, Issue 3, 2013, Pages 726-739

  Bleuet, P ^a   Audoit, G ^a   Barnes, J P ^a   Bertheau, J ^b   Dabin, Y ^c   Dansas, H ^a   Fabbri, J M ^a   Florin, B ^a   Gergaud, P ^a   Grenier, A ^a   Haberfehlner, G ^a   Lay, E ^a   Laurencin, J ^a   Serra, R ^a   Villanova, J ^c  

^a CEA GRENOBLE   (France)

^b STMICROELECTRONICS   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

3D; atom probe tomography; electron tomography; focused ion beam; sample preparation; X ray tomography

Indexed keywords

EID: 84878001314     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927613000330     Document Type: Review

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