Focused ion beam preparation of samples for X-ray nanotomography

Journal of Synchrotron Radiation

Volumn 19, Issue 5, 2012, Pages 789-796

  Lombardo, Jeffrey J ^a   Ristau, Roger A ^a   Harris, William M ^a   Chiu, Wilson K S ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

focused ion beam; sample preparation; solid oxide fuel cell; X ray nanotomography

Indexed keywords

AVERAGE PARTICLE SIZE; BULK MATERIALS; FIB/SEM; FOCUSED BEAMS; HARD MATERIAL; MATERIAL ANALYSIS; REGION OF INTEREST; SAMPLE HOLDERS; SAMPLE PREPARATION; SIZE AND SHAPE; X-RAY NANOTOMOGRAPHY;

ELECTRON MICROSCOPY; FOCUSED ION BEAMS; SOLID OXIDE FUEL CELLS (SOFC);

X RAYS;

ION;

ARTICLE; LABORATORY DIAGNOSIS; METHODOLOGY; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY; X RAY;

IONS; MICROSCOPY, ELECTRON, SCANNING; PARTICLE SIZE; SPECIMEN HANDLING; TOMOGRAPHY, X-RAY; X-RAYS;

EID: 84864184539     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049512027252     Document Type: Article

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