X-ray nano computerised tomography of SOFC electrodes using a focused ion beam sample-preparation technique

Journal of the European Ceramic Society

Volumn 30, Issue 8, 2010, Pages 1809-1814

  Shearing, P R ^a   Gelb, J ^b   Brandon, N P ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b XRADIA INC   (United States)

Author keywords

Focused ion beam; Fuel cells; Microstructure; SOFC; X ray methods

Indexed keywords

ELECTRODE MATERIAL; FOCUSED-ION-BEAM SYSTEM; GEOMETRICAL CONSTRAINTS; HIGH-RESOLUTION TOMOGRAPHY; LENGTH SCALE; NANO-CT; ORDERS OF MAGNITUDE; PREPARATION TECHNIQUE; SAMPLE GEOMETRY; SOFC; X RAY METHODS; X-RAY FIELD;

BEAM PLASMA INTERACTIONS; COMPUTER CRIME; COMPUTERIZED TOMOGRAPHY; ELECTROCHEMICAL ELECTRODES; FOCUSED ION BEAMS; ION BOMBARDMENT; IONS; MICROSTRUCTURE; SOLID OXIDE FUEL CELLS (SOFC); X RAY ANALYSIS;

X RAYS;

EID: 77950368456     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2010.02.004     Document Type: Article

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