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Volumn 15, Issue 4, 2012, Pages 158-165
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The future of atom probe tomography
b
CAMECA
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ADVANCED MATERIALS;
ATOM PROBE TOMOGRAPHY;
COMPUTER MODELS;
DESIGN AND DEVELOPMENT;
SCIENCE COMMUNITY;
DESIGN;
COMPUTER SIMULATION;
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EID: 84860805502
PISSN: 13697021
EISSN: None
Source Type: Journal
DOI: 10.1016/S1369-7021(12)70069-X Document Type: Review |
Times cited : (84)
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References (64)
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