High-speed AFM image scanning using observer-based MPC-notch control

IEEE Transactions on Nanotechnology

Volumn 12, Issue 2, 2013, Pages 246-254

  Rana, M S ^a   Pota, H R ^a   Petersen, Ian R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Atomic force microscope (AFM); model predictive control; notch filter; piezoelectric tube scanner (PTS); system identification

Indexed keywords

ACCURATE TRACKING; ATOMIC FORCE MICROSCOPE (AFM); HIGH-SPEED AFM; MODEL PREDICTIVE; PIEZOELECTRIC TUBE SCANNERS; POSITION SENSORS; SCANNED IMAGES; TRACKING ERRORS;

ATOMIC FORCE MICROSCOPY; IDENTIFICATION (CONTROL SYSTEMS); MODEL PREDICTIVE CONTROL; NOTCH FILTERS; PIEZOELECTRICITY; SCANNING; TUBES (COMPONENTS);

PREDICTIVE CONTROL SYSTEMS;

EID: 84874975472     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2013.2243752     Document Type: Article

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