Model predictive control of atomic force microscope for fast image scanning

Proceedings of the IEEE Conference on Decision and Control

Volumn , Issue , 2012, Pages 2477-2482

  Rana, M S ^a   Pota, H R ^a   Petersen, I R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTROLLERS; PREDICTIVE CONTROL SYSTEMS; SCANNING;

AFM IMAGING; FAST-TRACKING; IMAGE SCANNING; PI CONTROLLER; PIEZOELECTRIC TUBES; PROPER DESIGN; SCANNING SPEED;

MODEL PREDICTIVE CONTROL;

EID: 84874252854     PISSN: 07431546     EISSN: 25762370     Source Type: Conference Proceeding    
DOI: 10.1109/CDC.2012.6426103     Document Type: Conference Paper

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