Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy

Ultramicroscopy

Volumn 125, Issue , 2013, Pages 72-80

  Tromp, R M ^a,b   Schramm, S M ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b LEIDEN UNIVERSITY   (Netherlands)

Author keywords

Aberration correction; Contrast transfer function; LEEM; TEM

Indexed keywords

ABERRATION CORRECTION; ABERRATION-CORRECTED ELECTRON MICROSCOPY; CONTRAST TRANSFER FUNCTION; DEFOCUS; DESIGN PROCEDURE; ELECTRON ENERGIES; IMAGING LENS; LEEM; NEGATIVE VALUES; OBJECTIVE LENS; POSITIVE VALUE; RESOLUTION LIMITS; SMALL DISTURBANCES; TRANSFER OF INFORMATION;

DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPY; INSTRUMENTS; OPTICAL PROPERTIES; TRANSFER FUNCTIONS; TRANSMISSION ELECTRON MICROSCOPY;

OPTIMIZATION;

ARTICLE; CONTRAST TRANSFER FUNCTION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; LOW ENERGY ELECTRON MICROSCOPY; MATHEMATICAL MODEL; PROCESS OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84872426030     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.09.007     Document Type: Article

References (24)

1. Hawkes P.W. Biology of the Cell 2001, 93:432-439.
2. Aberration-corrected Electron Microscopy 2008, vol. 153. Academic Press, Amsterdam.
3. Haider M., Braunshausen G., Schwan E. Optik 1995, 99:167.
4. Haider M., Uhlemann S., Schwan E., Rose H., Kabius B., Urban K. Nature 1998, 392:768.
5. Batson P.E., Dellby N., Krivanek O.L. Nature 2002, 418:617.
6. Krivanek O.L., Dellby N., Spence A.J., Camps R.A., Brown L.M. Institute of Physics Conference Series 1997, 153(Section 2):35-40. Proc. EMAG.
7. Scherzer O. Berichte der Bunsen-Gesellschaft 1970, 74:1154.
8. Urban K.W., Jia C.-L., Houben L., Lentzen M., Mi S.-B., Tillman K. Philosophical Transaction of the Royal Society 2009, A367:3735.
9. Chang L.Y., Kirkland A.I., Titchmarsh J.M. Ultramicroscopy 2006, 106:301.
10. Lentzen M. Microscopy and Microanalysis 2008, 14:16-26.
11. Barthel J., Thust A. Ultramicroscopy 2010, 111:27.
12. Biskupek J., Hartel P., Haider M., Kaiser U. Ultramicroscopy 2012, 116:1.
13. Schramm S.M., Molen S.J.van der, Tromp R.M. Physical Review Letters 2012, 109:163901.
14. Bauer E. Reports on Progress in Physics 1994, 57:895.
15. Pang A.B., Müller Th., Altman M.S., Bauer E. Journal of Physics: Condensed Matter 2009, 21:314006.
16. Schramm S.M., Pang A.B., Altman M.S., Tromp R.M. Ultramicroscopy 2012, 115:88.
17. Haider M., Müller H., Uhlemann S., Zach J., Loebau U., Hoeschen R. Ultramicroscopy 2008, 108:167.
18. Williams D.B., Carter C.B. Transmission Electron Microscopy: A Textbook for Materials Science, Part III: Imaging 1996, Plenum Press, New York. first ed.
19. Linck M., Freitag B., Kujawa S., Lehmann M., Niermann T. Ultramicroscopy 2012, 116:13.
20. Schmidt Th., Marchetto H., Lévesque P.L., Groh U., Maier F., Preikszas D., Hartel P., Spehr R., Lilienkamp G., Engel W., Fink R., Bauer E., Rose H., Umbach E., Freund H.-J. Ultramicroscopy 2010, 110:1358.
21. Tromp R.M., Hannon J.B., Wan W., Berghaus A., Schaff O. Ultramicroscopy 2010, 110:852.
22. R.M. Tromp, W. Wan, S.M. Schramm, Ultramicroscopy in press.
23. Tromp R.M. Ultramicroscopy 2011, 111:273.
24. R.M. Tromp, J.B. Hannon, W. Wan, A. Berghaus, O. Schaff, Ultramicroscopy in: Proceedings of FEMMS Conference, in press. http://dx.doi.org/10.1016/j.ultramic.2012.07.016.