A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM

Ultramicroscopy

Volumn 115, Issue , 2012, Pages 88-108

  Schramm, S M ^a   Pang, A B ^c,d   Altman, M S ^d   Tromp, R M ^a,b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c HUAIBEI NORMAL UNIVERSITY   (China)

^d HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Aberration correction; Contrast Transfer Function; Image calculation; Low energy electron microscopy; Photoemission electron microscopy; Resolution

Indexed keywords

ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRONS; OPTICAL RESOLVING POWER; TRANSFER FUNCTIONS;

ABERRATION CORRECTION; CONTRAST TRANSFER FUNCTION; IMAGE CALCULATIONS; LOW ENERGY ELECTRON MICROSCOPY; PHOTOEMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; CHROMATIC ABERRATION; CONTRAST TRANSFER FUNCTION; ELECTRON; ELECTRON MICROSCOPY; IMAGE CALCULATION; IMAGE PROCESSING; LIGHT RELATED PHENOMENA; LOW ENERGY ELECTRON MICROSCOPY; OPTICS; PHOTOEMISSION ELECTRON MICROSCOPY; REFERENCE VALUE; SCHERZER DEFOCUS VALUE; SPHERIC ABERRATION;

EID: 84859859319     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.11.005     Document Type: Article

References (30)

1. Hannon J.B., Tromp R.M. Low-energy electron microscopy for nanoscale characterization. Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization. 2011, World Scientific.
2. Altman M.S. Journal of Physics: Condensed Matter 2010, 22:084017.
3. Pang A.B., Müller Th., Altman M.S., Bauer E. Journal of Physics: Condensed Matter 2009, 21:314006.
4. Spence J.C.H. High Resolution Electron Microscopy 2003, Oxford University Press, Oxford. third ed.
5. Williams David B., Barry Carter C. Transmission Electron Microscopy: A Textbook for Materials Science, Part III: Imaging 1996, Plenum Press, New York. first ed.
6. Kennedy S.M., Schofield N.E., Paganin D.M., Jesson D.E. Surface Review and Letters 2009, 16:855.
7. Rempfer G.F., Desloge D.M., Skoczylas W.P., Griffith O.H. Microscopy and Microanalysis 1997, 3:14.
8. Tromp R.M., Hannon J.B., Ellis A.W., Wan W., Berghaus A., Schaff O. Ultramicroscopy 2010, 110:852.
9. Könenkamp R., Word R.C., Rempfer G.F., Dixon T., Almaraz L., Jones T. Ultramicroscopy 2010, 110:899.
10. Bauer E. Ultramicroscopy 1985, 17:51.
11. Hawkes P.W., Kasper E. Principles of Electron Optics 1989, Academic Press, London.
12. Preikszas D., Rose H. Journal of Electron Microscopy 1997, 46:1.
13. Schmidt T., Groh U., Fink R., Umbach E., Schaff O., Engel W., Richter B., Kuhlenbeck H., Schlögl R., Freund H.-J., Bradshaw A.M., Preikszas D., Hartel P., Spehr R., Rose H., Lilienkamp G., Bauer E., Benner G. Surface Review and Letters 2002, 9:223.
14. R.M. Tromp, W. Wan, S.M. Schramm, Ultramicroscopy, this issue. http://10.1016/j.ultramic.2011.09.011.
15. Frank J. Optik 1973, 38:519.
16. Hanßen K.-J., Trepte L. Optik 1971, 32:519.
17. Misell D.L. Journal of Physics D: Applied Physics 1976, 9:1849.
18. Scherzer O. Journal of Applied Physics 1949, 20:20.
19. Chang L.Y., Kirkland A.I., Titchmarsh J.M. Ultramicroscopy 2006, 106:301.
20. Tromp R.M. Ultramicroscopy 2011, 111:273.
21. Chung W.F., Altman M.S. Ultramicoscopy 1998, 74:237.
22. Wu D., Lau W.K., He Z.Q., Feng Y.J., Altman M.S., Chan C.T. Physical Review B 2000, 62:8366.
23. Goodman J.W. Introduction to Fourier Optics 1996, McGraw-Hill, New York. second ed.
24. Urban K.W., Jia C.L., Houben L., Lentzen M., Mi S.B., Tillmann K. Philosophical Transactions of the Royal Society A 2009, 367:3735.
25. Lichte H. Ultramicroscopy 1991, 38:13.
26. van Gastel R., Sikharulidze I., Schramm S., Abrahams J.P., Poelsema B., Tromp R.M., van der Molen S.J. Ultramicroscopy 2009, 110:33.
27. Sharma K.K. Optics: Principles and Applications 2006, Academic Press, Amsterdam. first ed.
28. Gardiner C.W. Handbook of Stochastic Methods 1985, Springer, Berlin. second ed.
29. Feng J., Padmore H., Wei D.H., Anders S., Wu Y., Scholl A., Robin D. Review of Scientific Instruments 2002, 73:1514.
30. Tromp R.M., Fujikawa Y., Hannon J.B., Ellis A.W., Berghaus A., Schaff O. Journal of Physics: Condensed Matter 2009, 21:314007.