Fourier optics of image formation in LEEM

Journal of Physics Condensed Matter

Volumn 21, Issue 31, 2009, Pages

  Pang, A B ^a   Müller, Th ^b   Altman, M S ^a   Bauer, Ernst ^b  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE LENS; CURRENT INSTABILITY; DIFFRACTION CONTRAST; EMISSION MICROSCOPY; IMAGE FEATURES; IMAGE FORMATIONS; IMAGING ERRORS; LOW ENERGY ELECTRON MICROSCOPY; OBJECTIVE LENS; PHASE OBJECT; SOURCE CHARACTERISTICS; SURFACE STEPS;

ABERRATIONS; DIFFRACTION; LENSES; LIGHT; OPTICAL INSTRUMENTS; TRANSMISSION ELECTRON MICROSCOPY;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 70249106749     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/31/314006     Document Type: Article

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