Intrinsic instability of aberration-corrected electron microscopes

Physical Review Letters

Volumn 109, Issue 16, 2012, Pages

  Schramm, S M ^a   Van Der Molen, S J ^a   Tromp, R M ^a,b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; CONTRAST TRANSFER FUNCTION; INTRINSIC INSTABILITY; NEAR OPTIMUM; SCIENCE AND TECHNOLOGY; SUBATOMIC RESOLUTION;

ATOMIC PHYSICS; PHYSICS;

STABILITY;

EID: 84867518313     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.163901     Document Type: Article

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