Negative spherical aberration ultrahigh-resomtion imaging in corrected transmission electron microscopy

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 367, Issue 1903, 2009, Pages 3735-3753

  Urban, Knut W ^a   Jia, Chun Lin ^a   Houben, Lothar ^a   Lentzen, Markus ^a   Mi, Shao Bo ^a   Tillmann, Karsten ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aberration correction; Contrast; Electron microscopy; Ferroelectrics

Indexed keywords

ABERRATIONS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ATOMIC RESOLUTION; CONTRAST; CRYSTALLINE SAMPLES; FERROELECTRICS; HIGH CONTRAST; PHASE CONTRASTS; SPHERICAL ABERRATIONS;

ELECTRONS;

EID: 70349411717     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2009.0134     Document Type: Article

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