Effects of residual aberrations explored on single-walled carbon nanotubes

Ultramicroscopy

Volumn 116, Issue , 2012, Pages 1-7

  Biskupek, Johannes ^a   Hartel, Peter ^b   Haider, Maximilian ^b   Kaiser, Ute ^a  

^a UNIVERSITY OF ULM   (Germany)

^b CEOS GmbH   (Germany)

Author keywords

Aberration correction; Carbon nanotubes; HRTEM; Residual aberration

Indexed keywords

ABERRATION CORRECTION; ABERRATION-CORRECTED; HRTEM; IMAGE SIMULATIONS; RESIDUAL ABERRATION; SPHERICAL ABERRATIONS;

CARBON NANOTUBES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

SINGLE WALLED NANOTUBE;

AMPLITUDE MODULATION; ARTICLE; CONTROLLED STUDY; GEOMETRY; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE PROCESSING; IMAGE RECONSTRUCTION; LIMIT OF DETECTION; MODULATION TRANSFER FUNCTION; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84859928404     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.008     Document Type: Article

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