A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results

Ultramicroscopy

Volumn 127, Issue , 2013, Pages 25-39

  Tromp, R M ^a   Hannon, J B ^a   Wan, W ^b   Berghaus, A ^c   Schaff, O ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c SPECS SURFACE NANO ANALYSIS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; ELECTRON ENERGIES; ELECTRON MIRRORS; INDEPENDENT CONTROL; LOW ENERGY ELECTRON MICROSCOPES; PHOTO-ELECTRON EMISSION; SPHERICAL ABERRATION COEFFICIENTS; SPHERICAL ABERRATIONS;

MICROSCOPIC EXAMINATION; MOLECULAR PHYSICS;

MIRRORS;

ARTICLE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; EQUIPMENT DESIGN; FILTER; ILLUMINATION; IMAGE PROCESSING; LENS; LOW ENERGY ELECTRON MICROSCOPE; MATHEMATICAL ANALYSIS; PHASE TRANSITION; PHOTO ELECTRON EMISSION MICROSCOPE; PROCESS CONTROL; PROCESS DEVELOPMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84875546032     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.016     Document Type: Article

References (12)

1. Tromp R.M., Hannon J.B., Ellis A.W., Wan W., Berghaus A., Schaff O. Ultramicroscopy 2010, 110:852. (We note that the horizontal scale in Fig. 6 of this reference must be multiplied by a factor 8.5).
2. Fujikawa Y., Sakurai T., Tromp R.M. Physical Review 2009, B79:121401.
3. Fujikawa Y., Sakurai T., Tromp R.M. Physical Review Letters 2008, 100:126803.
4. Schramm S.M., Kautz J., Berghaus A., Schaff O., Tromp R.M., van der Molen S.J. IBM Journal of Research and Development 2011, 55(4):1:1-1:7. 10.1147/JRD.2011.2150691.
5. van Gastel R., Sikharulidze I., Schramm S., Abrahams J.P., Poelsema B., Tromp R.M., van der Molen S.J. Ultramicroscopy 2009, 110:33.
6. Tromp R.M., Fujikawa Y., Hannon J.B., Ellis A.W., Berghaus A., Schaff O. Journal of Physics: Condensed Matter 2009, 21:314007.
7. Kolarik V., Mankos M., Veneklasen L.H. Optik 1991, 87:1.
8. Tromp R.M., Mankos M., Reuter M.C., Ellis A.W., Copel M. Surface Review and Letters 1998, 5:1189.
9. R. Degenhardt, Ph.D. Dissertation (Technische Hochschule Darmstadt, 1992).
10. W. Wan, unpublished.
11. Tromp R.M. Ultramicroscopy 2011, 111:273.
12. S.M. Schramm, A.B. Pang, M.S. Altman, R.M. Tromp, Ultramicroscopy 115 (2012) 88.