Nanoscale spatial resolution probes for scanning thermal microscopy of solid state materials

Journal of Applied Physics

Volumn 112, Issue 11, 2012, Pages

  Tovee, P ^a   Pumarol, M ^a   Zeze, D ^b   Kjoller, Kevin ^c   Kolosov, O ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b DURHAM UNIVERSITY   (United Kingdom)

^c Anasys Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT AREAS; ELECTRICAL PHENOMENA; EXPERIMENTAL MEASUREMENTS; FORCE SENSING CANTILEVERS; GRAPHENE SHEETS; HIGH THERMAL CONDUCTIVITY; LATERAL RESOLUTION; LENGTH SCALE; LONGITUDINAL DIMENSION; LOW THERMAL CONDUCTIVITY; MESOSCOPIC LENGTH SCALE; MICROMACHINED; NANOSCALE RESOLUTIONS; NANOSCALE SEMICONDUCTOR DEVICES; NANOSCALE SPATIAL RESOLUTION; NANOSCALE TIP; NOVEL DESIGN; PHYSICAL MODEL; PROBE APEX; SCANNING THERMAL MICROSCOPY; SIMILAR MATERIAL; SOLID-STATE MATERIALS; SPATIAL RESOLUTION; SUBSURFACE PROPERTIES; THEORETICAL APPROACH; THERMAL CONDUCTANCE; THERMAL PERFORMANCE; THERMAL PROPERTIES OF NANOSTRUCTURES; THERMAL SENSORS;

GRAPHENE; IMAGE RESOLUTION; MATERIALS PROPERTIES; MODELS; MULTIWALLED CARBON NANOTUBES (MWCN); NANOSTRUCTURES; POLYMERS; PROBES; SENSORS; THERMAL CONDUCTIVITY OF GASES;

NANOSTRUCTURED MATERIALS;

EID: 84871242404     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4767923     Document Type: Article

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