Attachment of carbon nanotubes to atomic force microscope probes

Ultramicroscopy

Volumn 107, Issue 10-11, 2007, Pages 1118-1122

  Gibson, Christopher T ^a   Carnally, Stewart ^a   Roberts, Clive J ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

018; 032; AFM; Carbon nanotubes; Tapping mode

Indexed keywords

ARC DISCHARGE; TAPPING MODE IMAGING; TAPPING MODE PROBES;

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRIC DISCHARGES; ELECTROPHORESIS; PROBES; SCANNING ELECTRON MICROSCOPY;

CARBON NANOTUBES;

CARBON NANOTUBE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; ELECTROPHORESIS; GEOMETRY; MECHANICAL PROBE; SCANNING ELECTRON MICROSCOPY;

EID: 34447646476     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.02.045     Document Type: Article

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